標題: | Quantitative analysis of magnetization reversal in patterned strip wire by magnetic force microscopy |
作者: | Chen, D. C. Chiang, D. P. Yao, Y. D. 材料科學與工程學系 Department of Materials Science and Engineering |
關鍵字: | magnetic force microscopy;magnetization reversal;permalloy film |
公開日期: | 1-九月-2006 |
摘要: | Magnetic force microscopy (MFM) was used to investigate the magnetization reversal process in a patterned strip wire of permalloy thin film. The magnitude of the phase-shift of tapping mode MFM changed with the varying interactive magnetic force between the magnetic tip and the sample. By analyzing the change in values of the phase-shift. the behaviors of magnetization reversal of different local regions in a patterned strip wire can be quantitatively analyzed. The intensity of the phase-shift in the wider end is stronger than that in the narrower one. In contrast, due to a strong anisotropic effect. the coercive force in the narrower end (9 Oe) is larger than that ill the wider one (8 Oe). Therefore, the H-c in the neck section could become strongly affected by the competition of the head-to-tail magnetic configurations in the two parts of the strip wire, and this results in a small H-c in the neck section. In addition, in a simple neck shape connection in a strip NiFe wire, a single domain configuration can be easily changed to a two single domain magnetic configuration. (C) 2006 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.jmmm.2006.02.014 http://hdl.handle.net/11536/11836 |
ISSN: | 0304-8853 |
DOI: | 10.1016/j.jmmm.2006.02.014 |
期刊: | JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS |
Volume: | 304 |
Issue: | 1 |
起始頁: | 23 |
結束頁: | 26 |
顯示於類別: | 會議論文 |