Spatially resolving the degradation of SPC thin-film transistors under AC stress

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Chang, Kai-Hsiang	en_US
dc.contributor.author	Lee, Ming-Hsien	en_US
dc.contributor.author	Lin, Horng-Chih	en_US
dc.contributor.author	Huang, Tiao-Yuan	en_US
dc.contributor.author	Lee, Yao-Jen	en_US
dc.date.accessioned	2014-12-08T15:16:15Z	-
dc.date.available	2014-12-08T15:16:15Z	-
dc.date.issued	2007	en_US
dc.identifier.isbn	978-1-4244-1891-6	en_US
dc.identifier.uri	http://hdl.handle.net/11536/12056	-
dc.language.iso	en_US	en_US
dc.title	Spatially resolving the degradation of SPC thin-film transistors under AC stress	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	2007 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, VOLS 1 AND 2	en_US
dc.citation.spage	246	en_US
dc.citation.epage	247	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000255857100126	-
顯示於類別：	會議論文