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dc.contributor.authorYin, GCen_US
dc.contributor.authorTang, MTen_US
dc.contributor.authorSong, YFen_US
dc.contributor.authorChen, FRen_US
dc.contributor.authorLiang, KSen_US
dc.contributor.authorDuewer, FWen_US
dc.contributor.authorYun, WBen_US
dc.contributor.authorKo, CHen_US
dc.contributor.authorShieh, HPDen_US
dc.date.accessioned2014-12-08T15:16:23Z-
dc.date.available2014-12-08T15:16:23Z-
dc.date.issued2006-06-12en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2211300en_US
dc.identifier.urihttp://hdl.handle.net/11536/12151-
dc.description.abstractAn energy-tunable transmission hard x-ray microscope with close to 60 nm spatial resolution in three dimensions (3D) has been developed. With a cone beam illumination, a zone plate of 50 nm outmost zone width, a stable mechanical design, and software feedback, we obtained tomographic data sets that are close to 60 nm spatial resolution. Meanwhile, the element specific imaging was also obtained by a differential absorption contrast technique used below and above the absorption of the element. Examples of advanced intergraded circuit devices are used to demonstrate the element selectivity and spatial resolution in 3D of the microscope.en_US
dc.language.isoen_USen_US
dc.titleEnergy-tunable transmission x-ray microscope for differential contrast imaging with near 60 nm resolution tomographyen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2211300en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume88en_US
dc.citation.issue24en_US
dc.citation.epageen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of Displayen_US
dc.identifier.wosnumberWOS:000238314800015-
dc.citation.woscount52-
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