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dc.contributor.authorChin, Aen_US
dc.contributor.authorLee, Ken_US
dc.date.accessioned2014-12-08T15:02:34Z-
dc.date.available2014-12-08T15:02:34Z-
dc.date.issued1996-06-10en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.115785en_US
dc.identifier.urihttp://hdl.handle.net/11536/1226-
dc.description.abstractWe report the growth of high quality molecular beam epitaxy (MBE) AlGaAs, AlGaAs/GaAs/ AlGaAs, and AlAs/GaAs/AlAs multiple quantum wells (MQWs) on (111)A GaAs substrates. For (111)A AlGaAs/GaAs/AlGaAs MQWs, there is no detectable photoluminescence (PL) at a growth temperature of 640 degrees C, and narrow PL linewidth can only be obtained at growth temperatures higher than 680 degrees C. A PL linewidth of 13.8 meV is measured at the growth temperature of 720 degrees C. To understand such growth temperature dependence of (111)A MQWs, we have investigated the material quality of (111)A AlGaAs at different growth temperatures. The strong PL integrated intensity of 640 degrees C grown (111)A AlGaAs indicates good material quality and a low concentration of non-radiative recombination centers. However, the broad PL linewidth of 640 degrees C grown (111)A AlGaAs indicates the strong compositional modulation and a rough growth front. We have used AlAs instead of AlGaAs in order to reduce the compositional modulation and smooth the interface. A PL linewidth of 13.4 meV is measured for 640 degrees C grown (111)A AlAs/GaAs/AlAs MQWs, which is the narrowest value for (111)A MQWs. (C) 1996 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleHigh quality Al(Ga)As/GaAs/Al(Ga)As quantum wells grown on (111)A GaAs substratesen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.115785en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume68en_US
dc.citation.issue24en_US
dc.citation.spage3437en_US
dc.citation.epage3439en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
Appears in Collections:Articles