| 標題: | Analysis of diffusive interface resistance for measurements with perpendicular current in Fe/Nb multilayers |
| 作者: | Huang, S. Y. Lee, S. F. Yu, C. Y. Hsu, S. Y. Yao, Y. D. 電子物理學系 Department of Electrophysics |
| 公開日期: | 15-四月-2006 |
| 摘要: | In this study, we investigated the electron transport properties of interface between a ferromagnet and a superconductor with flowing current perpendicular to plan (CPP) at 4.2 K in Fe/Nb multilayers. The CPP resistance increased linearly with layer thickness and with bilayer number. We extracted the unit area resistance value of one pair of interface for superconducting and normal Fe/Nb by using a series resistor model. Hence, we can quantitatively analyze the interface resistance between Fe and Nb in the diffusive regime. (C) 2006 American Institute of Physics. |
| URI: | http://dx.doi.org/10.1063/1.2176871 http://hdl.handle.net/11536/12365 |
| ISSN: | 0021-8979 |
| DOI: | 10.1063/1.2176871 |
| 期刊: | JOURNAL OF APPLIED PHYSICS |
| Volume: | 99 |
| Issue: | 8 |
| 結束頁: | |
| 顯示於類別: | 期刊論文 |

