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dc.contributor.authorKehn, Malcolm Ng Mouen_US
dc.date.accessioned2015-07-21T11:20:26Z-
dc.date.available2015-07-21T11:20:26Z-
dc.date.issued2014-10-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2014.2344626en_US
dc.identifier.urihttp://hdl.handle.net/11536/123976-
dc.description.abstractThe substrate integrated waveguide (SIW) comprising rectangular via-holes is herein treated by a rigorous full-wave modal analysis using the moment method entailing Green\'s functions for rectangular cavities and planar multilayer structures in the spectral domain. Modal dispersion graphs generated by this solution approach are compared with those obtained by an independent commercial full-wave solver. The ability of the modal solution in treating SIW junctions and discontinuities is demonstrated by the treatment of an interconnection between a conventional waveguide and a SIW using the mode-matching technique. Inhomogeneities within SIWs can also be accommodated by the technique, as showcased by a specific example of the so-called hard sidewalled SIW. Three avenues of losses, namely, dielectric, side-leakage, and conductor losses, are also investigated, thereby elucidating a tradeoff between the latter two.en_US
dc.language.isoen_USen_US
dc.subjectGreen's functionen_US
dc.subjectmoment methoden_US
dc.subjectspectral-domain techniqueen_US
dc.subjectsubstrate integrated waveguide (SIW)en_US
dc.titleModal Analysis of Substrate Integrated Waveguides With Rectangular Via-Holes Using Cavity and Multilayer Green\'s Functionsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TMTT.2014.2344626en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume62en_US
dc.citation.issue10en_US
dc.citation.spage2214en_US
dc.citation.epage2231en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000344990600002en_US
dc.citation.woscount0en_US
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