標題: Symmetrical Dipole Contribution from Planar Defects on m-plane ZnO Epitaxial Films
作者: Liu, Chung-Wei
Chang, Shoou-Jinn
Ho, Yen-Teng
Chang, Li
Lo, Kuang-Yao
Brahma, Sanjaya
材料科學與工程學系
Department of Materials Science and Engineering
關鍵字: Basal stacking fault;non-polar plane;second harmonic generation;ZnO
公開日期: 1-Jan-2014
摘要: The planar defects such as basal stacking faults (BSFs) are probed on m-plane ZnO grown on LaAlO3(112) substrate by reflective second harmonic generation (RSHG). The BSFs result in nonvanishing single-direction dipoles that behave similar to a mirror-like symmetrical dipole. The RSHG pattern from m-plane ZnO comprised of not only the bulk dipole contribution of ZnO but also an additional mirror-like symmetrical dipole contribution from BSF defects. Transmission electron microscopy image displays the presence of BSFs that lie in the c-plane of ZnO and agrees well with RSHG results. Planar BSFs are formed due to the anisotropic stress relaxation between m-plane ZnO film and LaAlO3(112) substrate, resulting in higher-quality m-plane ZnO films.
URI: http://hdl.handle.net/11536/124006
ISSN: 1573-4137
期刊: CURRENT NANOSCIENCE
Volume: 10
起始頁: 883
結束頁: 888
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