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dc.contributor.authorLehmhus, Dirken_US
dc.contributor.authorBosse, Stefanen_US
dc.contributor.authorLang, Walteren_US
dc.contributor.authorChao, Paul C.P.en_US
dc.contributor.authorChang, Fu-Kuoen_US
dc.date.accessioned2015-07-21T11:20:38Z-
dc.date.available2015-07-21T11:20:38Z-
dc.date.issued2014-07-01en_US
dc.identifier.issn1530-437Xen_US
dc.identifier.urihttp://dx.doi.org/10.1109/JSEN.2014.2330133en_US
dc.identifier.urihttp://hdl.handle.net/11536/124012-
dc.description.abstracten_US
dc.language.isoen_USen_US
dc.titleUntitleden_US
dc.typeArticleen_US
dc.identifier.doi10.1109/JSEN.2014.2330133en_US
dc.identifier.journalIEEE SENSORS JOURNALen_US
dc.citation.volume14en_US
dc.citation.spage2077en_US
dc.citation.epage2077en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000337150400018en_US
dc.citation.woscount0en_US
Appears in Collections:Articles


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