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dc.contributor.authorChang, Tsung-Shengen_US
dc.contributor.authorTone, Kaoruen_US
dc.contributor.authorWu, Chen-Huien_US
dc.date.accessioned2015-07-21T08:28:49Z-
dc.date.available2015-07-21T08:28:49Z-
dc.date.issued2015-01-01en_US
dc.identifier.issn0160-5682en_US
dc.identifier.urihttp://dx.doi.org/10.1057/jors.2013.139en_US
dc.identifier.urihttp://hdl.handle.net/11536/124055-
dc.description.abstractIt has been well recognized that to thoroughly evaluate a firm\'s performance, the evaluator must assess not only its past and present records but also future potential. However, to the best of our knowledge, there are no data envelopment analysis (DEA)-type models proposed in the literature that simultaneously take past, present and, especially, future performance indicators into account. Hence, this research aims at developing a new type of DEA model referred to as Intertemporal DEA models that can be used to fully measure a firm\'s efficiency by explicitly considering its key inputs and outputs involving the past-present-future time span. In this research, the proposed Intertemporal DEA models are applied to the performance evaluation of high-tech Integrated Circuit design companies in Taiwan to demonstrate their advantages over other DEA models that ignore intertemporal efficiency.en_US
dc.language.isoen_USen_US
dc.subjectdata envelopment analysisen_US
dc.subjectintertemporalen_US
dc.subjectperformance evaluationen_US
dc.subjectdynamicen_US
dc.subjectR&Den_US
dc.subjectmarket valueen_US
dc.titlePast-present-future Intertemporal DEA modelsen_US
dc.typeArticleen_US
dc.identifier.doi10.1057/jors.2013.139en_US
dc.identifier.journalJOURNAL OF THE OPERATIONAL RESEARCH SOCIETYen_US
dc.citation.volume66en_US
dc.citation.spage16en_US
dc.citation.epage32en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department運輸與物流管理系 註:原交通所+運管所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Transportation and Logistics Managementen_US
dc.identifier.wosnumberWOS:000346281800002en_US
dc.citation.woscount0en_US
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