標題: | A modified HICUM model for GaInP/GaAs HBT devices |
作者: | Tseng, SC Meng, CC Chen, WY Su, JY 電信工程研究所 Institute of Communications Engineering |
關鍵字: | transit time;GaInP/GaAs HBT;minority charge;HICUM and VBIC |
公開日期: | 1-Apr-2006 |
摘要: | A compact physics-based transit-time model is established for the GaInP/GaAs HBT device. The VBIC model fails to describe the transit-time frequency versus bias (I-C, V-CE), especially at low- and medium-current regimes. Starting with the HICUM model, we introduce a new time constant to describe the transit-time frequency versus bias (I-C, V-CE) more precisely. This model has obvious advantages over the VBIC model for showing the relation oj'f, versus bias (I-C, V-CE) in the low and medium current regimes for GaInP/GaAs HBT devices. (c) 2006 Wiley Periodicals, Inc. |
URI: | http://dx.doi.org/10.1002/mop.21474 http://hdl.handle.net/11536/12406 |
ISSN: | 0895-2477 |
DOI: | 10.1002/mop.21474 |
期刊: | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS |
Volume: | 48 |
Issue: | 4 |
起始頁: | 780 |
結束頁: | 783 |
Appears in Collections: | Articles |
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