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dc.contributor.authorTseng, SCen_US
dc.contributor.authorMeng, CCen_US
dc.contributor.authorChen, WYen_US
dc.contributor.authorSu, JYen_US
dc.date.accessioned2014-12-08T15:16:53Z-
dc.date.available2014-12-08T15:16:53Z-
dc.date.issued2006-04-01en_US
dc.identifier.issn0895-2477en_US
dc.identifier.urihttp://dx.doi.org/10.1002/mop.21474en_US
dc.identifier.urihttp://hdl.handle.net/11536/12406-
dc.description.abstractA compact physics-based transit-time model is established for the GaInP/GaAs HBT device. The VBIC model fails to describe the transit-time frequency versus bias (I-C, V-CE), especially at low- and medium-current regimes. Starting with the HICUM model, we introduce a new time constant to describe the transit-time frequency versus bias (I-C, V-CE) more precisely. This model has obvious advantages over the VBIC model for showing the relation oj'f, versus bias (I-C, V-CE) in the low and medium current regimes for GaInP/GaAs HBT devices. (c) 2006 Wiley Periodicals, Inc.en_US
dc.language.isoen_USen_US
dc.subjecttransit timeen_US
dc.subjectGaInP/GaAs HBTen_US
dc.subjectminority chargeen_US
dc.subjectHICUM and VBICen_US
dc.titleA modified HICUM model for GaInP/GaAs HBT devicesen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/mop.21474en_US
dc.identifier.journalMICROWAVE AND OPTICAL TECHNOLOGY LETTERSen_US
dc.citation.volume48en_US
dc.citation.issue4en_US
dc.citation.spage780en_US
dc.citation.epage783en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000236268900047-
dc.citation.woscount0-
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