完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chiu, Kun-An | en_US |
dc.contributor.author | Tian, Jr-Sheng | en_US |
dc.contributor.author | Wu, Yue-Han | en_US |
dc.contributor.author | Peng, Chun-Yen | en_US |
dc.contributor.author | Chang, Li | en_US |
dc.date.accessioned | 2015-07-21T11:20:49Z | - |
dc.date.available | 2015-07-21T11:20:49Z | - |
dc.date.issued | 2014-11-25 | en_US |
dc.identifier.issn | 0257-8972 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/j.surfcoat.2014.03.012 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/124277 | - |
dc.description.abstract | Crack-free (111) homoepitaxial diamond films were grown on Ni-coated diamond substrates by microwave plasma chemical vapor deposition. After diamond deposition, the Ni islands with a size of 50-1000 nm were formed and embedded underneath the diamond films. The tensile stress in the diamond films evaluated with micro-Raman spectroscopy can be significantly reduced with the embedded Ni islands, which allows the growth of similar to 5 mu m thick crack-free (111) homoepitaxial diamond films with a good quality, compared with those directly deposited on substrates without coating. (c) 2014 Elsevier B.V. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Homoepitaxial growth | en_US |
dc.subject | Diamond | en_US |
dc.subject | Nickel | en_US |
dc.subject | CVD | en_US |
dc.title | Stress reduction of (111) homoepitaxial diamond films on nickel-coated substrate | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.surfcoat.2014.03.012 | en_US |
dc.identifier.journal | SURFACE & COATINGS TECHNOLOGY | en_US |
dc.citation.volume | 259 | en_US |
dc.citation.spage | 358 | en_US |
dc.citation.epage | 362 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000347589900039 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |