標題: Extraction of optical constants from maxima of fringing reflectance spectra
作者: Yen, Shun-Tung
Chung, Pei-Kang
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-二月-2015
摘要: We propose a scheme to extract the refractive index and the extinction coefficient of dielectrics. The extraction needs only a reflectance spectrum with reliable successive maxima of fringing oscillations measured from a dielectric film that is either freestanding or on metal. With the film thickness known in advance, we determine the refractive index spectrum from the fringing oscillation periods and then the extinction coefficient spectrum from the upper envelope. The method is demonstrated to work well for GaAs and Ge. (C) 2015 Optical Society of America
URI: http://dx.doi.org/10.1364/AO.54.000663
http://hdl.handle.net/11536/124347
ISSN: 1559-128X
DOI: 10.1364/AO.54.000663
期刊: APPLIED OPTICS
Volume: 54
起始頁: 663
結束頁: 668
顯示於類別:期刊論文