Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cheng, Ching-Ren | en_US |
dc.contributor.author | Shiau, Jyh-Jen Horng | en_US |
dc.date.accessioned | 2015-07-21T08:28:53Z | - |
dc.date.available | 2015-07-21T08:28:53Z | - |
dc.date.issued | 2015-02-01 | en_US |
dc.identifier.issn | 0748-8017 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1002/qre.1751 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/124362 | - |
dc.description.abstract | The purpose of this paper is to provide a novel distribution-free control chart for monitoring the location parameter vector of a multivariate process in phase I analysis. To be robust to the process distribution, the spatial sign statistic that defines the multivariate direction of an observation is used to construct a Shewhart-type control chart for detecting out-of-control observations in historical phase I data. The proposed control chart is distribution free in the sense that the false-positive rate (or false alarm rate), the proportion of wrongly classified in-control samples, can be controlled at the specified value for elliptical-direction distributions. In addition, we demonstrate through simulation studies that the false-positive rate of the proposed chart is robust to the shift size of the out-of-control condition if we only delete the most extreme out-of-control observation at each iteration of phase I analysis. Compared with the traditional Hotelling\'s T-2 control chart and some of its robust versions, the proposed chart is generally more powerful in detecting out-of-control observations and more robust to the normality assumption. Copyright (c) 2014 John Wiley & Sons, Ltd. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | NSPC | en_US |
dc.subject | distribution free | en_US |
dc.subject | spatial sign | en_US |
dc.subject | multivariate control chart | en_US |
dc.subject | phase I analysis | en_US |
dc.title | A Distribution-Free Multivariate Control Chart for Phase I Applications | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1002/qre.1751 | en_US |
dc.identifier.journal | QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL | en_US |
dc.citation.volume | 31 | en_US |
dc.citation.spage | 97 | en_US |
dc.citation.epage | 111 | en_US |
dc.contributor.department | 統計學研究所 | zh_TW |
dc.contributor.department | Institute of Statistics | en_US |
dc.identifier.wosnumber | WOS:000348642800008 | en_US |
dc.citation.woscount | 0 | en_US |
Appears in Collections: | Articles |