標題: Reliability-Driven Chip-Level Design for High-Frequency Digital Microfluidic Biochips
作者: Yu, Shang-Tsung
Yeh, Sheng-Han
Ho, Tsung-Yi
資訊工程學系
Department of Computer Science
關鍵字: Digital microfluidics;electrode addressing;reliability;wire routing
公開日期: 1-四月-2015
摘要: Electrowetting-on-dielectric (EWOD) chips have emerged as popular actuators for droplet-based digital microfluidic biochips. The chip-level design of EWOD chips allows for the integration electrode addressing and wire routing, thus helping cope with the increasing complexity of biochemical assays. Furthermore, high-frequency EWODs also facilitate finishing time-sensitive bioassays such as incubation and emerging flash chemistry in specific time periods. However, the reliability of the EWOD chip is reduced by the contact angle change reduction problem as a result of the repeated and frequent switching of electrodes. Thus, the chip-level design of EWOD chips should consider reliability, electrode addressing, and the wire routing problem. This paper presents a graph-based chip-level design algorithm. By setting the switching-time constraint, the number of switching times can be limited to minimize the impact of the contact angle change reductions problem. Also, a progressive addressing and routing approach is proposed to overcome the complex wire routing problem. Experimental results show the proposed algorithm effectively minimizes the impact of the contact angle change reduction problem, thus providing a reliable chip-level design with a feasible wire routing solution with the required number of pins.
URI: http://dx.doi.org/10.1109/TCAD.2014.2387828
http://hdl.handle.net/11536/124473
ISSN: 0278-0070
DOI: 10.1109/TCAD.2014.2387828
期刊: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Volume: 34
起始頁: 529
結束頁: 539
顯示於類別:期刊論文