完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chang, Chiao-Yun | en_US |
dc.contributor.author | Li, Heng | en_US |
dc.contributor.author | Shih, Yang-Ta | en_US |
dc.contributor.author | Lu, Tien-Chang | en_US |
dc.date.accessioned | 2015-07-21T08:29:42Z | - |
dc.date.available | 2015-07-21T08:29:42Z | - |
dc.date.issued | 2015-03-02 | en_US |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.4914116 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/124524 | - |
dc.description.abstract | We systematically investigated the influence of nanoscale V-pits on the internal quantum efficiency (IQE) of InGaN multiple quantum wells (MQWs) by adjusting the underlying superlattices (SLS). The analysis indicated that high barrier energy of sidewall MQWs on V-pits and long diffusion distance between the threading dislocation (TD) center and V-pit boundary were crucial to effectively passivate the non-radiative centers of TDs. For a larger V-pit, the thicker sidewall MQW on V-pit would decrease the barrier energy. On the contrary, a shorter distance between the TD center and V-pit boundary would be observed in a smaller V-pit, which could increase the carrier capturing capability of TDs. An optimized V-pit size of approximately 200-250 nm in our experiment could be concluded for MQWs with 15 pairs SLS, which exhibited an IQE value of 70%. (C) 2015 AIP Publishing LLC. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Manipulation of nanoscale V-pits to optimize internal quantum efficiency of InGaN multiple quantum wells | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.4914116 | en_US |
dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
dc.citation.volume | 106 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000351069900004 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |