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dc.contributor.authorChang, Chiao-Yunen_US
dc.contributor.authorLi, Hengen_US
dc.contributor.authorShih, Yang-Taen_US
dc.contributor.authorLu, Tien-Changen_US
dc.date.accessioned2015-07-21T08:29:42Z-
dc.date.available2015-07-21T08:29:42Z-
dc.date.issued2015-03-02en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4914116en_US
dc.identifier.urihttp://hdl.handle.net/11536/124524-
dc.description.abstractWe systematically investigated the influence of nanoscale V-pits on the internal quantum efficiency (IQE) of InGaN multiple quantum wells (MQWs) by adjusting the underlying superlattices (SLS). The analysis indicated that high barrier energy of sidewall MQWs on V-pits and long diffusion distance between the threading dislocation (TD) center and V-pit boundary were crucial to effectively passivate the non-radiative centers of TDs. For a larger V-pit, the thicker sidewall MQW on V-pit would decrease the barrier energy. On the contrary, a shorter distance between the TD center and V-pit boundary would be observed in a smaller V-pit, which could increase the carrier capturing capability of TDs. An optimized V-pit size of approximately 200-250 nm in our experiment could be concluded for MQWs with 15 pairs SLS, which exhibited an IQE value of 70%. (C) 2015 AIP Publishing LLC.en_US
dc.language.isoen_USen_US
dc.titleManipulation of nanoscale V-pits to optimize internal quantum efficiency of InGaN multiple quantum wellsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4914116en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume106en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000351069900004en_US
dc.citation.woscount0en_US
Appears in Collections:Articles