完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Pearn, Wen Lea | en_US |
dc.contributor.author | Wu, Chin Chieh | en_US |
dc.contributor.author | Wu, Chia Huang | en_US |
dc.date.accessioned | 2015-07-21T08:29:44Z | - |
dc.date.available | 2015-07-21T08:29:44Z | - |
dc.date.issued | 2015-07-03 | en_US |
dc.identifier.issn | 0094-9655 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1080/00949655.2014.914211 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/124624 | - |
dc.description.abstract | Process capability index C-pk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on C-pk using two approaches, Classical method and Bayesian method. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | process capability index | en_US |
dc.subject | Classical method | en_US |
dc.subject | Bayesian method | en_US |
dc.subject | credible interval | en_US |
dc.subject | lower confidence bound | en_US |
dc.title | Estimating process capability index C-pk: classical approach versus Bayesian approach | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1080/00949655.2014.914211 | en_US |
dc.identifier.journal | JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION | en_US |
dc.citation.volume | 85 | en_US |
dc.citation.issue | 10 | en_US |
dc.citation.spage | 2007 | en_US |
dc.citation.epage | 2021 | en_US |
dc.contributor.department | 統計學研究所 | zh_TW |
dc.contributor.department | 工業工程與管理學系 | zh_TW |
dc.contributor.department | Institute of Statistics | en_US |
dc.contributor.department | Department of Industrial Engineering and Management | en_US |
dc.identifier.wosnumber | WOS:000352642500006 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |