統計資料
總造訪次數
| 檢視 | |
|---|---|
| Investigation of thermal stability and reliability of HfO2 based resistive random access memory devices with cross-bar structure | 20 |
本月總瀏覽
| 六月 2025 | 七月 2025 | 八月 2025 | 九月 2025 | 十月 2025 | 十一月 2025 | 十二月 2025 | |
|---|---|---|---|---|---|---|---|
| Investigation of thermal stability and reliability of HfO2 based resistive random access memory devices with cross-bar structure | 0 | 0 | 1 | 0 | 0 | 0 | 0 |
檔案下載
| 檢視 |
|---|
國家瀏覽排行
| 檢視 | |
|---|---|
| United States | 12 |
| Taiwan | 5 |
| Russia | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Menlo Park | 6 |
| Taipei | 5 |
| Chandler | 3 |
| Edmond | 2 |
| Kensington | 1 |