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dc.contributor.authorWeng, Chun-Jenen_US
dc.contributor.authorHsu, Ken-Yuhen_US
dc.contributor.authorChen, Yung-Fuen_US
dc.date.accessioned2019-04-03T06:38:06Z-
dc.date.available2019-04-03T06:38:06Z-
dc.date.issued2015-05-04en_US
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OE.23.011755en_US
dc.identifier.urihttp://hdl.handle.net/11536/124823-
dc.description.abstractA direct image method of surface reflectivities on a cleaved fiber end with a filtered halogen lamp and a TE-cooled CCD with high dynamic range is proposed to measure the multi-wavelength refractive index profiling (RIP). A polished black glass is used to be a reference standard for measuring the absolute reflectivity of the fiber end. With the developed calibration procedures, both the spatially dependent sensitivity and spectral responsivity of the CCD pixels can be eliminated to achieve the high spatial accuracy. Tested fiber is connected with a fiber terminator to prevent errors from the backside return light. With the present method, the RIP can be precisely measured for not only multi-mode fibers but also single-mode fibers. (C) 2015 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleExploiting the image of the surface reflectivity to measure refractive index profiling for various optical fibersen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OE.23.011755en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.citation.volume23en_US
dc.citation.issue9en_US
dc.citation.spage11755en_US
dc.citation.epage11762en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.department光電工程研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of EO Enginerringen_US
dc.identifier.wosnumberWOS:000354337700083en_US
dc.citation.woscount2en_US
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