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dc.contributor.authorHsu, Hui-Linen_US
dc.contributor.authorLeong, Keith R.en_US
dc.contributor.authorHalamicek, Michaelen_US
dc.contributor.authorTeng, I-Juen_US
dc.contributor.authorMahtani, Pratishen_US
dc.contributor.authorJuang, Jenh-Yihen_US
dc.contributor.authorJian, Sheng-Ruien_US
dc.contributor.authorQian, Lien_US
dc.contributor.authorKherani, Nazir P.en_US
dc.date.accessioned2015-07-21T11:21:57Z-
dc.date.available2015-07-21T11:21:57Z-
dc.date.issued2014-11-03en_US
dc.identifier.issn0040-6090en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.tsf.2014.02.038en_US
dc.identifier.urihttp://hdl.handle.net/11536/124874-
dc.description.abstractA significant improvement in the photoluminescence of erbium doped amorphous carbon (a-C: H(Er)) is reported. The effects of the RF power on the anode and cathode a-C: H films were investigated in terms of the microstructural and local bonding features. It was determined that Er doped a-C: H films should be placed on the anode to obtain wider bandgap and lower percentage of sp(2) carbon bonding. The metalorganic compound, tris(6,6,7,7,8,8,8-heptafluoro-2,2-dimethyl-3,5-octanedionate) Erbium(+III) or Er(fod)(3), was incorporated in-situ into an a-C: H host by metalorganic rf plasma enhanced chemical vapor deposition. This technique provides the capability of doping Er in a vertically uniform profile. The high erbium concentration (3.9 at.%), partial fluorination of the surrounding ligands, and the large optical bandgap of the host a-C: H are the primary factors that enable enhancement of the photoluminescence. (C) 2014 Elsevier B. V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectErbium metalorganic compounden_US
dc.subjectHydrogenated amorphous carbon (a-C:H)en_US
dc.subjectFluorinationen_US
dc.titleIn-situ doping of erbium in hydrogenated amorphous carbon by low temperature metalorganic radio frequency plasma enhanced chemical vapor depositionen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.tsf.2014.02.038en_US
dc.identifier.journalTHIN SOLID FILMSen_US
dc.citation.volume570en_US
dc.citation.spage429en_US
dc.citation.epage435en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000345230900046en_US
dc.citation.woscount0en_US
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