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dc.contributor.authorChen, Hsin-Chiehen_US
dc.contributor.authorChen, Wei-Chungen_US
dc.contributor.authorChou, Ying-Weien_US
dc.contributor.authorChien, Meng-Weien_US
dc.contributor.authorWey, Chin-Longen_US
dc.contributor.authorChen, Ke-Horngen_US
dc.contributor.authorLin, Ying-Hsien_US
dc.contributor.authorTsai, Tsung-Yenen_US
dc.contributor.authorLee, Chao-Chengen_US
dc.date.accessioned2015-07-21T08:31:25Z-
dc.date.available2015-07-21T08:31:25Z-
dc.date.issued2014-01-01en_US
dc.identifier.isbn978-1-4799-3286-3en_US
dc.identifier.issnen_US
dc.identifier.urihttp://hdl.handle.net/11536/125018-
dc.description.abstractConventional constant-on-time (COT) control for DC-DC buck converter is apt to be affected by the noise caused by parasitic effect including not properly specified and temperature dependent equivalent series resistance (ESR) and equivalent series inductance (ESL). As a result, the safety operation area (SOA) of the COT is limited by the selection of external components. In this paper, the calibrated anti-ESL (CAESL) technique and the calibrated gain and BW (CGB) technique for alleviating ESL and ESR variation, respectively, are proposed to ensure a robust COT control. Furthermore, degraded output regulation caused by enlarged ESL effect due to input battery voltage variation is also solved by the CAESL technique. The proposed COT converter fabricated in 28nm CMOS technology uses an output capacitor with an ESR smaller than 1m Omega, output ripple of 20mV, and high efficiency higher than 95%. The CAESL circuit can tolerate ESL voltage variation from 0 to 50mV even when operation temperature varies from -40 to 120 degrees C.en_US
dc.language.isoen_USen_US
dc.subjectcalibrated anti-ESL (CAESL)en_US
dc.subjectcalibrated gain and BW (CGB)en_US
dc.subjectequivalent series resistance (ESR)en_US
dc.subjectequivalent series inductor (ESL)en_US
dc.titleAnti-ESL/ESR Variation Robust Constant-on-time Control for DC-DC Buck Converter in 28nm CMOS Technologyen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2014 IEEE PROCEEDINGS OF THE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC)en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000349122300137en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper