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dc.contributor.authorLai, Ying-Yuen_US
dc.contributor.authorMatsutani, Akihiroen_US
dc.contributor.authorLu, Tien-Changen_US
dc.contributor.authorWang, Shing-Chungen_US
dc.contributor.authorKoyama, Fumioen_US
dc.date.accessioned2019-04-03T06:47:41Z-
dc.date.available2019-04-03T06:47:41Z-
dc.date.issued2015-01-01en_US
dc.identifier.isbn978-1-62841-462-2en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://dx.doi.org/10.1117/12.2077391en_US
dc.identifier.urihttp://hdl.handle.net/11536/125097-
dc.description.abstractWe designed and fabricated a suspended SiC-based membrane high contrast grating (HCG) reflectors. The rigorous coupled-wave analysis (RCWA) was employed to verify the structural parameters including grating periods, grating height, filling factors and air-gap height. From the optimized simulation results, the designed SiC-based membrane HCG has a wide reflection stopband (reflectivity (R) > 90%) of 135 nm for the TE polarization, which centered at 480 nm. The suspended SiC-based membrane HCG reflectors were fabricated by nanoimprint lithography and two-step etching technique. This achievement should have an impact on numerous III-N based photonic devices operating in the blue wavelength or even ultraviolet region.en_US
dc.language.isoen_USen_US
dc.subjectSiCen_US
dc.subjectHCGen_US
dc.subjectNanoimprinten_US
dc.subjectIII-Nen_US
dc.titleFabrication of SiC Membrane HCG Blue Reflector Using Nanoimprint Lithographyen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.2077391en_US
dc.identifier.journalHIGH CONTRAST METASTRUCTURES IVen_US
dc.citation.volume9372en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000353321800003en_US
dc.citation.woscount1en_US
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