Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shi, Yiyu | en_US |
dc.contributor.author | Chen, Hung-Ming | en_US |
dc.date.accessioned | 2015-07-21T08:31:16Z | - |
dc.date.available | 2015-07-21T08:31:16Z | - |
dc.date.issued | 2014-01-01 | en_US |
dc.identifier.isbn | 978-3-9815370-2-4 | en_US |
dc.identifier.issn | 1530-1591 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/125144 | - |
dc.description.abstract | en_US | |
dc.language.iso | en_US | en_US |
dc.title | Memcomputing: the Cape of Good Hope | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2014 DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION (DATE) | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000354965500264 | en_US |
dc.citation.woscount | 0 | en_US |
Appears in Collections: | Conferences Paper |