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dc.contributor.authorShi, Yiyuen_US
dc.contributor.authorChen, Hung-Mingen_US
dc.date.accessioned2015-07-21T08:31:16Z-
dc.date.available2015-07-21T08:31:16Z-
dc.date.issued2014-01-01en_US
dc.identifier.isbn978-3-9815370-2-4en_US
dc.identifier.issn1530-1591en_US
dc.identifier.urihttp://hdl.handle.net/11536/125144-
dc.description.abstracten_US
dc.language.isoen_USen_US
dc.titleMemcomputing: the Cape of Good Hopeen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2014 DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION (DATE)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000354965500264en_US
dc.citation.woscount0en_US
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