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dc.contributor.authorYan, JKen_US
dc.contributor.authorChang, Len_US
dc.date.accessioned2014-12-08T15:17:11Z-
dc.date.available2014-12-08T15:17:11Z-
dc.date.issued2006-03-01en_US
dc.identifier.issn0040-6090en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.tsf.2005.07.097en_US
dc.identifier.urihttp://hdl.handle.net/11536/12541-
dc.description.abstractDiamond films on 1 x 1 cm(2) Si (100) substrates were synthesized by microwave plasma chemical vapor deposition (MWCVD) using mixture of methane and hydrogen gases. Bias-enhanced nucleation method was used to avoid any mechanical pretreatments. Distribution of deposited diamond crystallites in terms of density, size, and morphology has been significantly improved over all the Si substrate surface area by using a novel designed Mo anode. Films were characterized from the center to the edges of substrates using scanning electron microscopy, transmission electron microscope, and Raman analysis. The results also show that uniform diamond films can be obtained by short bias nucleation period using a dome-shaped Mo anode. The diamond crystallites were directly deposited on Si substrate. Using 2% CH4 in the growth stage, high quality diamond films in the < 100 > texture can be obtained with relatively smooth surface. (c) 2005 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectdiamonden_US
dc.subjectchemical vapor depositionen_US
dc.subjectnucleationen_US
dc.subjectgrowthen_US
dc.titleChemical vapor deposition of uniform and high-quality diamond films by bias-enhanced nucleation methoden_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.tsf.2005.07.097en_US
dc.identifier.journalTHIN SOLID FILMSen_US
dc.citation.volume498en_US
dc.citation.issue1-2en_US
dc.citation.spage230en_US
dc.citation.epage234en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000235270500045-
Appears in Collections:Conferences Paper


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