X-ray吸收光譜與臨場電子量測系統介紹與其應用

Abstract

我們建立了一個基於同步加速器所設置的跨時代系統－稱為E-X裝置，此系統能夠在進行X光吸收光譜（XAS）和磁圓偏振二向性（XMCD）下，同時做電性控制或量測，即此系統可以在臨場下，研究有關電子運輸，元素和軌道選擇性的微觀磁性質。這獨步的方法可觀察到具磁電響應的材料/元件之自旋極化電子態的實時變化。本研究利用了E-X裝置，研究施加電場下，稀磁性半導體Zn1-xCoxO (CZO)之鈷與氧的自旋極化狀態，確立基於E-X裝置優異的性能，無論在低溫（〜30 K）或室溫，皆可在施加不同電壓下，檢測其測試樣品的訊號之變化。

We report a synchrotron-based setup capable of performing x-ray absorption spectroscopy (XAS) and x-ray magnetic circular dichroism (XMCD) with simultaneous electrical control characterizations. The setup can enable research concerning electrical transport, element- and orbital-selective magnetization with an in-situ fashion. It is a unique approach to the real-time change of spin-polarized electronic state of a material/device exhibiting magneto-electric responses. The performance of the setup was tested by probing the spin-polarized states of cobalt and oxygen of Zn1-xCoxO dilute magnetic semiconductor under applied voltages, both at low (~30K) and room temperatures, and signal variation upon the change of applied voltage was clearly detected.