LCD偏光片貼附製程之碎亮點缺陷改善研究

Abstract

本論文以TFT LCD (薄膜電晶體液晶顯示器) 產業為背景，主要研究目的為偏光片貼附製程產生碎亮點缺陷之改善研究，降低碎亮點不良率，達到降低工廠生產成本。 Particle 缺陷目前在TFT LCD 產業之中是最常見也是難克服之問題，其牽涉層面很廣，最常發生原因為生產製程環境汙染與產品本身設計搭配性所造成，而其中碎亮點缺陷，是近來車用高階產品(亮度高,對比高) ，面臨最頭痛的缺陷之一。 針對TFT LCD材料面進行體質改善，分析不同PoIyimide材料與Photo Spacer材料對碎亮點缺陷之影響，透過本研究之結果顯示，材料的選擇能有效改善碎亮點，不良率由改善前的~20%大幅降低至~0%，碎亮點之缺陷完全地消失，產品品質得以提升。

This thesis, TFT LCD (ThinFilm Transistor Liquid Crystal Display) industry as a background, main research objective in order to improvement of Particle-Galaxy defect after attach the polarizer process, reduce the Galaxy defect ratio, to reduce production costs. Particle defect in TFT LCD industry now is the most common and difficult to overcome the problem, which involves many levels, most often the reason for production processes and environmental pollution caused by the product itself, designed to match, andGalaxy defect, are vehicles with higher-order products (high brightness, a high contrast), faces one of biggest flaws. For TFT LCD materials for improvement, analysis of different PoIyimide materials and Photo Spacer material effects on the Galaxy defect, through the results of this study show that broken material selection can improve highlights malnutrition by improving the dramatic reduction of ~20% to ~0% before, broken highlights flaws completely disappears, product quality can be improved.