完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 林家儀 | en_US |
dc.contributor.author | Lin, Chia-Yi | en_US |
dc.contributor.author | 彭文理 | en_US |
dc.contributor.author | Pearn, Wen-Lea | en_US |
dc.date.accessioned | 2015-11-26T00:55:47Z | - |
dc.date.available | 2015-11-26T00:55:47Z | - |
dc.date.issued | 2015 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#GT070253336 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/126005 | - |
dc.description.abstract | 允收抽樣計畫是指在一個買賣雙方都能承擔的風險下,決定一批產品是否能夠被允收。許多研究都曾針對允收抽樣計畫提出討論,而實際情況中已經存在非對稱規格區間之製程,因此我們必須選用一個適當的指標來設計允收抽樣計畫,因此,本研究提出了製程能力指標Cpk"的允收抽樣計畫,來處理極低不良率下產品是非對稱規格區間之允收抽樣準則。我們列出不同風險下,所需抽驗之樣本數及允收臨界值,決策者可依據本篇研究之成果,來決定產品在非對稱規格區間下所需之抽驗產品樣本數以及產品允收臨界值,並能在實務中做出有效決策。 | zh_TW |
dc.description.abstract | Product acceptance sampling plan has been one of the most practical tools used in classical quality control applications. Whether the manufactured product should be accepted or rejected based on the inspected sample data under the designated risk given by the producer and the customer. The problem has received substantial research attention. We know that processes with asymmetric tolerances should be considered in real situation. We need to use an adequate index to design acceptance sampling plan. Hence, In this thesis, we consider the product acceptance sampling plan based on process capability index Cpk" to deal with product acceptance determination for process with asymmetric tolerances and very low fraction. We tabulate the required sample size and the corresponding critical acceptance value for various producer’s risks and consumer’s risks with the capability requirement average quality level (AQL) and lot tolerance percent defective (LTPD). The computational results are useful to the practitioners for their in-plant applications. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | 允收抽樣計畫 | zh_TW |
dc.subject | 允收臨界值 | zh_TW |
dc.subject | 非對稱規格 | zh_TW |
dc.subject | 製程能力指標 | zh_TW |
dc.subject | Acceptance sampling plan | en_US |
dc.subject | critical acceptance values | en_US |
dc.subject | asymmetric tolerances | en_US |
dc.subject | process capability index | en_US |
dc.title | 非對稱規格區間下製程能力指標 Cpk"之允收抽樣計畫 | zh_TW |
dc.title | A Variable Sampling Plan Based on Cpk" for Product Acceptance Determination with Asymmetric Tolerances | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 工業工程與管理系所 | zh_TW |
顯示於類別: | 畢業論文 |