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dc.contributor.author郭書喬en_US
dc.contributor.authorKuo, Shu-Chiaoen_US
dc.contributor.author陳冠能en_US
dc.date.accessioned2015-11-26T00:55:52Z-
dc.date.available2015-11-26T00:55:52Z-
dc.date.issued2015en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT070150103en_US
dc.identifier.urihttp://hdl.handle.net/11536/126067-
dc.language.isoen_USen_US
dc.subject三維積體電路zh_TW
dc.subject銅與銅接合zh_TW
dc.subjectBondingen_US
dc.subject3-D Integrationen_US
dc.title三維積體電路之低溫銅與銅接合結構設計及可靠度研究zh_TW
dc.titleA Novel Direct Cu-to-Cu Bonded Structure and Reliability Investigation in 3-D Integrationen_US
dc.typeThesisen_US
dc.contributor.department電子工程學系 電子研究所zh_TW
顯示於類別:畢業論文