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dc.contributor.authorYeh, TTen_US
dc.contributor.authorWang, JHen_US
dc.contributor.authorHsieh, TEen_US
dc.contributor.authorShieh, HPDen_US
dc.date.accessioned2014-12-08T15:17:28Z-
dc.date.available2014-12-08T15:17:28Z-
dc.date.issued2006-02-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.45.1394en_US
dc.identifier.urihttp://hdl.handle.net/11536/12661-
dc.description.abstractIn this work, we demonstrate a distinct superresolution phenomenon and signal properties of an optical disk with a semiconductor-doped glass (SDG) mask layer containing CdSe nanoparticles. It was found that the 69 nm marks could be consistently retrieved at reading power (P-r) = 4 mW with carrier-to-noise ratio (CNR) = 13.56 dB. The signals were clearly resolved with CNRs nearly equal to 40 dB at P-r = 4 mW when the recorded marks were larger than 100 nm. The cyclability test indicated that the CdSe-SiO2 SDG layer might serve as a stable and reliable optical mask layer in 10(5) readout cycles.en_US
dc.language.isoen_USen_US
dc.subjectsuperresolutionen_US
dc.subjectsemiconductor-doped glassen_US
dc.subjectmask layeren_US
dc.subjectCdSe nanoparticlesen_US
dc.subjectCdSe-SiO2en_US
dc.titleSuperresolution structure optical disk with semiconductor-doped glass mask layer containing CdSe nanoparticlesen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1143/JJAP.45.1394en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERSen_US
dc.citation.volume45en_US
dc.citation.issue2Ben_US
dc.citation.spage1394en_US
dc.citation.epage1397en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000235978200075-
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