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dc.contributor.author呂玉琦en_US
dc.contributor.authorLu, Yu-Chien_US
dc.contributor.author趙天生en_US
dc.contributor.authorChao, Tien-Shengen_US
dc.date.accessioned2015-11-26T00:57:07Z-
dc.date.available2015-11-26T00:57:07Z-
dc.date.issued2015en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT070252020en_US
dc.identifier.urihttp://hdl.handle.net/11536/126919-
dc.language.isoen_USen_US
dc.subject應變zh_TW
dc.subject無接面zh_TW
dc.subject奈米線zh_TW
dc.subject電晶體zh_TW
dc.subject氨電漿zh_TW
dc.subject變溫zh_TW
dc.subject熱載子注入zh_TW
dc.subjectstrainen_US
dc.subjectjunctionlessen_US
dc.subjectnanowireen_US
dc.subjecttransistoren_US
dc.subjectNH3 plasmaen_US
dc.subjecttemperature dependenceen_US
dc.subjecthot carrier injectionen_US
dc.title應變在矽無接面奈米線電晶體上之效應zh_TW
dc.titleStrain Effects on Silicon Junctionless Nanowire Transistorsen_US
dc.typeThesisen_US
dc.contributor.department電子物理系所zh_TW
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