單電子元件高頻濾波技術之特性

Abstract

為了探討在介觀尺度的量測下電磁波雜訊的影響，我們透過鎳金屬薄膜可知道其電子溫度會高於低溫恆溫器所設定之溫度，也許這是因為到達樣品之高頻雜訊的影響。於是我們展示了雜訊對於超導態中的單電子電晶體的影響也利用不同的濾波器來改善量測的狀況，並發現金屬薄膜濾波器對於高頻雜訊有極高效果的改善以及我們所製備之單電子電晶體原件是足夠靈敏來做為偵測電荷的原件。

We investigate the influence of electromagnetic noise on the measurement of mesoscopic samples. Using a Nickel film, we show that the electron temperature of the sample can remain above that of the cryostat. This may be due to high frequency noise reaching the sample. We demonstrate the influence of this noise on the properties of a superconducting SET, and use different filters to improve the measurement. We find that metal film resistors give good filtering, allowing us to characterize the SET device. We find that our SET device is suitable for sensitive charge detection experiments.