Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jenq, Shrane Ning | en_US |
dc.contributor.author | Wan, Chi Chao | en_US |
dc.contributor.author | Wang, Yung Yun | en_US |
dc.contributor.author | Li, Hung Wei | en_US |
dc.contributor.author | Liu, Po Tsun | en_US |
dc.contributor.author | Chen, Jing Hon | en_US |
dc.date.accessioned | 2014-12-08T15:17:35Z | - |
dc.date.available | 2014-12-08T15:17:35Z | - |
dc.date.issued | 2006 | en_US |
dc.identifier.issn | 1099-0062 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/12752 | - |
dc.identifier.uri | http://dx.doi.org/10.1149/1.2236375 | en_US |
dc.description.abstract | A tapered shape of Cu pattern by electrodeposition through mask is preferred for fabricating metal line on thin-film transistors (TFTs). The influence of individual organic additive [polyethylene glycol (PEG), bis-3-sodiumsulfopropyl disulfide (SPS)] on the sidewall shape of the Cu pattern was identified. A compromising effect shows up when both PEG and SPS are added owing to the competition of the behavior of two different organic additives during Cu electrodeposition. Therefore, a method has been developed for the fabrication of copper pattern used in TFTs, which forms a tapered pattern in one single Cu deposition step. (c) 2006 The Electrochemical Society. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Tapered Cu pattern metallization by electrodeposition through mask | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1149/1.2236375 | en_US |
dc.identifier.journal | ELECTROCHEMICAL AND SOLID STATE LETTERS | en_US |
dc.citation.volume | 9 | en_US |
dc.citation.issue | 10 | en_US |
dc.citation.spage | C167 | en_US |
dc.citation.epage | C170 | en_US |
dc.contributor.department | 顯示科技研究所 | zh_TW |
dc.contributor.department | Institute of Display | en_US |
dc.identifier.wosnumber | WOS:000239936600014 | - |
dc.citation.woscount | 5 | - |
Appears in Collections: | Articles |