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dc.contributor.authorJenq, Shrane Ningen_US
dc.contributor.authorWan, Chi Chaoen_US
dc.contributor.authorWang, Yung Yunen_US
dc.contributor.authorLi, Hung Weien_US
dc.contributor.authorLiu, Po Tsunen_US
dc.contributor.authorChen, Jing Honen_US
dc.date.accessioned2014-12-08T15:17:35Z-
dc.date.available2014-12-08T15:17:35Z-
dc.date.issued2006en_US
dc.identifier.issn1099-0062en_US
dc.identifier.urihttp://hdl.handle.net/11536/12752-
dc.identifier.urihttp://dx.doi.org/10.1149/1.2236375en_US
dc.description.abstractA tapered shape of Cu pattern by electrodeposition through mask is preferred for fabricating metal line on thin-film transistors (TFTs). The influence of individual organic additive [polyethylene glycol (PEG), bis-3-sodiumsulfopropyl disulfide (SPS)] on the sidewall shape of the Cu pattern was identified. A compromising effect shows up when both PEG and SPS are added owing to the competition of the behavior of two different organic additives during Cu electrodeposition. Therefore, a method has been developed for the fabrication of copper pattern used in TFTs, which forms a tapered pattern in one single Cu deposition step. (c) 2006 The Electrochemical Society.en_US
dc.language.isoen_USen_US
dc.titleTapered Cu pattern metallization by electrodeposition through masken_US
dc.typeArticleen_US
dc.identifier.doi10.1149/1.2236375en_US
dc.identifier.journalELECTROCHEMICAL AND SOLID STATE LETTERSen_US
dc.citation.volume9en_US
dc.citation.issue10en_US
dc.citation.spageC167en_US
dc.citation.epageC170en_US
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentInstitute of Displayen_US
dc.identifier.wosnumberWOS:000239936600014-
dc.citation.woscount5-
顯示於類別:期刊論文