完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLin, Meng-Yuen_US
dc.contributor.authorWang, Cheng-Hungen_US
dc.contributor.authorChang, Shu-Weien_US
dc.contributor.authorLee, Si-Chenen_US
dc.contributor.authorLin, Shih-Yenen_US
dc.date.accessioned2015-12-02T02:59:06Z-
dc.date.available2015-12-02T02:59:06Z-
dc.date.issued2015-07-29en_US
dc.identifier.issn0022-3727en_US
dc.identifier.urihttp://dx.doi.org/10.1088/0022-3727/48/29/295106en_US
dc.identifier.urihttp://hdl.handle.net/11536/127856-
dc.description.abstractIn this work, we first investigate the effects of partial pressures and flow rates of precursors on the single-crystal graphene growth using chemical vapor depositions on copper foils. These factors are shown to be critical to the growth rate, seeding density and size of graphene single crystals. The prepared graphene films in millimeter sizes are then bubbling transferred to silicon-dioxide/silicon substrates for high-mobility graphene transistor fabrications. After high-temperature annealing and hexamethyldisilazane passivation, the water attachment is removed from the graphene channel. The elimination of uncontrolled doping and enhancement of carrier mobility accompanied by these procedures indicate that they are promising for fabrications of graphene transistors.en_US
dc.language.isoen_USen_US
dc.subjectgrapheneen_US
dc.subjecttransistorsen_US
dc.subjectpassivationen_US
dc.titlePassivated graphene transistors fabricated on a millimeter-sized single-crystal graphene film prepared with chemical vapor depositionen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/0022-3727/48/29/295106en_US
dc.identifier.journalJOURNAL OF PHYSICS D-APPLIED PHYSICSen_US
dc.citation.volume48en_US
dc.citation.issue29en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of Displayen_US
dc.identifier.wosnumberWOS:000357604800011en_US
dc.citation.woscount0en_US
顯示於類別:期刊論文