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dc.contributor.authorTsou, C. H.en_US
dc.contributor.authorLiang, H. C.en_US
dc.contributor.authorWen, C. P.en_US
dc.contributor.authorSu, K. W.en_US
dc.contributor.authorHuang, K. F.en_US
dc.contributor.authorChen, Y. F.en_US
dc.date.accessioned2019-04-03T06:38:45Z-
dc.date.available2019-04-03T06:38:45Z-
dc.date.issued2015-06-15en_US
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OE.23.016339en_US
dc.identifier.urihttp://hdl.handle.net/11536/127890-
dc.description.abstractWe quantitatively investigate the influence of high-order transverse modes on the self-mode locking (SML) in an optically pumped semiconductor laser (OPSL) with a nearly hemispherical cavity. A physical aperture is inserted into the cavity to manipulate the excitation of high-order transverse modes. Experimental measurements reveal that the laser is operated in a well-behaved SML state with the existence of the TEM0,0 mode and the first high-order transverse mode. While more high-order transverse modes are excited, it is found that the pulse train is modulated by more beating frequencies of transverse modes. The temporal behavior becomes the random dynamics when too many high-order transverse modes are excited. We observe that the temporal trace exhibits an intermittent mode-locked state in the absence of high-order transverse modes. (C) 2015 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleExploring the influence of high order transverse modes on the temporal dynamics in an optically pumped mode-locked semiconductor disk laseren_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OE.23.016339en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.citation.volume23en_US
dc.citation.issue12en_US
dc.citation.spage16339en_US
dc.citation.epage16347en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000356902500114en_US
dc.citation.woscount4en_US
Appears in Collections:Articles


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