標題: Nanocontact Disorder in Nanoelectronics for Modulation of Light and Gas Sensitivities
作者: Lin, Yen-Fu
Chang, Chia-Hung
Hung, Tsu-Chang
Jian, Wen-Bin
Tsukagoshi, Kazuhito
Wu, Yue-Han
Chang, Li
Liu, Zhaoping
Fang, Jiye
材料科學與工程學系
電子物理學系
Department of Materials Science and Engineering
Department of Electrophysics
公開日期: 11-八月-2015
摘要: To fabricate reliable nanoelectronics, whether by top-down or bottom-up processes, it is necessary to study the electrical properties of nanocontacts. The effect of nanocontact disorder on device properties has been discussed but not quantitatively studied. Here, by carefully analyzing the temperature dependence of device electrical characteristics and by inspecting them with a microscope, we investigated the Schottky contact and Mott's variable-range-hopping resistances connected in parallel in the nanocontact. To interpret these parallel resistances, we proposed a model of Ti/TiOx in the interface between the metal electrodes and nanowires. The hopping resistance as well as the nanocontact disorder dominated the total device resistance for high-resistance devices, especially at low temperatures. Furthermore, we introduced nanocontact disorder to modulate the light and gas responsivities of the device; unexpectedly, it multiplied the sensitivities compared with the intrinsic sensitivity of the nanowires. Our results improve the collective understanding of electrical contacts to low-dimensional semiconductor devices and will aid performance optimization in future nanoelectronics.
URI: http://dx.doi.org/10.1038/srep13035
http://hdl.handle.net/11536/127988
ISSN: 2045-2322
DOI: 10.1038/srep13035
期刊: SCIENTIFIC REPORTS
Volume: 5
起始頁: 0
結束頁: 0
顯示於類別:期刊論文


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