完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLin, Yen-Fuen_US
dc.contributor.authorChang, Chia-Hungen_US
dc.contributor.authorHung, Tsu-Changen_US
dc.contributor.authorJian, Wen-Binen_US
dc.contributor.authorTsukagoshi, Kazuhitoen_US
dc.contributor.authorWu, Yue-Hanen_US
dc.contributor.authorChang, Lien_US
dc.contributor.authorLiu, Zhaopingen_US
dc.contributor.authorFang, Jiyeen_US
dc.date.accessioned2019-04-03T06:36:08Z-
dc.date.available2019-04-03T06:36:08Z-
dc.date.issued2015-08-11en_US
dc.identifier.issn2045-2322en_US
dc.identifier.urihttp://dx.doi.org/10.1038/srep13035en_US
dc.identifier.urihttp://hdl.handle.net/11536/127988-
dc.description.abstractTo fabricate reliable nanoelectronics, whether by top-down or bottom-up processes, it is necessary to study the electrical properties of nanocontacts. The effect of nanocontact disorder on device properties has been discussed but not quantitatively studied. Here, by carefully analyzing the temperature dependence of device electrical characteristics and by inspecting them with a microscope, we investigated the Schottky contact and Mott's variable-range-hopping resistances connected in parallel in the nanocontact. To interpret these parallel resistances, we proposed a model of Ti/TiOx in the interface between the metal electrodes and nanowires. The hopping resistance as well as the nanocontact disorder dominated the total device resistance for high-resistance devices, especially at low temperatures. Furthermore, we introduced nanocontact disorder to modulate the light and gas responsivities of the device; unexpectedly, it multiplied the sensitivities compared with the intrinsic sensitivity of the nanowires. Our results improve the collective understanding of electrical contacts to low-dimensional semiconductor devices and will aid performance optimization in future nanoelectronics.en_US
dc.language.isoen_USen_US
dc.titleNanocontact Disorder in Nanoelectronics for Modulation of Light and Gas Sensitivitiesen_US
dc.typeArticleen_US
dc.identifier.doi10.1038/srep13035en_US
dc.identifier.journalSCIENTIFIC REPORTSen_US
dc.citation.volume5en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000359287300001en_US
dc.citation.woscount4en_US
顯示於類別:期刊論文


文件中的檔案:

  1. 73597fbc7d65c37f68481ea1cb74349d.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。