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dc.contributor.authorYu, Tung-Yuanen_US
dc.contributor.authorPan, Fu-Mingen_US
dc.contributor.authorChang, Cheng-Yien_US
dc.contributor.authorLin, Jian-Siangen_US
dc.contributor.authorHuang, Wen-Hsienen_US
dc.date.accessioned2015-12-02T02:59:18Z-
dc.date.available2015-12-02T02:59:18Z-
dc.date.issued2015-07-28en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4927740en_US
dc.identifier.urihttp://hdl.handle.net/11536/128026-
dc.description.abstractIn this study, we fabricated a-Se based photosensors with an alternating multilayer structure of a-Se and AsxSe1-x by rotational thermal evaporation deposition. During the deposition of the amorphous AsxSe1-x layers, As diffuses into the underlying a-Se component layers, thereby improving the thermal stability of the multilayer photosensor and thus increasing the breakdown electric field. Although the As doping introduces carrier traps in the a-Se layers, the multilayer photosensors demonstrate an effective quantum efficiency comparable to the single-layered a-Se sensor under the blue light illumination but are with a lower dark current density by two orders of magnitude. In addition to the top AsxSe1-x layer being functioning as an electron blocking layer, carrier traps present in the multilayer structure may decrease the drift mobility of charge carriers and disturb electric field distribution in the photosensors, thereby suppressing the dark current. (C) 2015 AIP Publishing LLC.en_US
dc.language.isoen_USen_US
dc.titleThermal stability and photoconductive properties of photosensors with an alternating multilayer structure of amorphous Se and AsxSe1-xen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4927740en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume118en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000358928000046en_US
dc.citation.woscount0en_US
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