完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLin, Taiy-Inen_US
dc.contributor.authorChen, Alexanderen_US
dc.contributor.authorChen, Shou-Ien_US
dc.contributor.authorLeu, Jihperngen_US
dc.date.accessioned2015-12-02T02:59:20Z-
dc.date.available2015-12-02T02:59:20Z-
dc.date.issued2015-07-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.7567/JJAP.54.076701en_US
dc.identifier.urihttp://hdl.handle.net/11536/128059-
dc.description.abstractIn this paper, we present static thermal analysis of stress and strain on a thin-film transistor liquid-crystal display (TFT-LCD) panel and their correlation with light leakage phenomena under high-temperature durability test. Three-dimensional (3D) finite element analysis (FEA) is coupled with experimental parameters of key components of the TFT-LCD panel for the analysis. A strong correlation exists between light leakage and retardation difference induced by stress on triacetyl cellulose (TAC) films. Moreover, shrinkage in stretched poly(vinyl alcohol) (PVA) film and modulus of the adhesive layer are key factors affecting stress distribution and displacement of polarizer stack. An increase in Young\'s modulus (E) of the adhesive layer effectively reduces polarizer shrinkage and light leakage at the center of the panel. A TAC film with lower Young\'s modulus and/or coefficient of thermal expansion (CTE) is also an effective solution. (C) 2015 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleEffects of thermomechanical properties of polarizer components on light leakage in thin-film transistor liquid-crystal displaysen_US
dc.typeArticleen_US
dc.identifier.doi10.7567/JJAP.54.076701en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume54en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000358303000042en_US
dc.citation.woscount0en_US
顯示於類別:期刊論文