Title: Technology and knowledge document cluster analysis for enterprise R&D strategic planning
Authors: Hsu, Fu-Chiang
Trappey, Amy J. C.
Trappey, Charles V.
Hou, Jiang-Liang
Liu, Shang-Jyh
管理科學系
科技法律研究所
Department of Management Science
Institute of Technology Law
Keywords: knowledge document clustering;patent analysis;technology clustering
Issue Date: 2006
Abstract: Through technology and knowledge document analysis, companies can realise the condition of specified technology development and the potential competitors in the market. As patents provide exclusive right and legal protection for patent inventors, patents play an important role in the development of technology. This paper presents the process of patent knowledge extraction and methodologies of patent analysis to improve the efficiency of patent analysis. Furthermore, the methodologies proposed in this paper include patent map analysis, patent technology clustering, patent document clustering and technology maturity measurement. Through these methodologies, companies can gain rich information and perforin better in patent management. Moreover, the strategic plans of R&D can also be determined using the methodologies proposed in this paper.
URI: http://hdl.handle.net/11536/12813
http://dx.doi.org/10.1504/IJTM.2006.010271
ISSN: 0267-5730
DOI: 10.1504/IJTM.2006.010271
Journal: INTERNATIONAL JOURNAL OF TECHNOLOGY MANAGEMENT
Volume: 36
Issue: 4
Begin Page: 336
End Page: 353
Appears in Collections:Articles