標題: | Technology and knowledge document cluster analysis for enterprise R&D strategic planning |
作者: | Hsu, Fu-Chiang Trappey, Amy J. C. Trappey, Charles V. Hou, Jiang-Liang Liu, Shang-Jyh 管理科學系 科技法律研究所 Department of Management Science Institute of Technology Law |
關鍵字: | knowledge document clustering;patent analysis;technology clustering |
公開日期: | 2006 |
摘要: | Through technology and knowledge document analysis, companies can realise the condition of specified technology development and the potential competitors in the market. As patents provide exclusive right and legal protection for patent inventors, patents play an important role in the development of technology. This paper presents the process of patent knowledge extraction and methodologies of patent analysis to improve the efficiency of patent analysis. Furthermore, the methodologies proposed in this paper include patent map analysis, patent technology clustering, patent document clustering and technology maturity measurement. Through these methodologies, companies can gain rich information and perforin better in patent management. Moreover, the strategic plans of R&D can also be determined using the methodologies proposed in this paper. |
URI: | http://hdl.handle.net/11536/12813 http://dx.doi.org/10.1504/IJTM.2006.010271 |
ISSN: | 0267-5730 |
DOI: | 10.1504/IJTM.2006.010271 |
期刊: | INTERNATIONAL JOURNAL OF TECHNOLOGY MANAGEMENT |
Volume: | 36 |
Issue: | 4 |
起始頁: | 336 |
結束頁: | 353 |
Appears in Collections: | Articles |