標題: Technology and knowledge document cluster analysis for enterprise R&D strategic planning
作者: Hsu, Fu-Chiang
Trappey, Amy J. C.
Trappey, Charles V.
Hou, Jiang-Liang
Liu, Shang-Jyh
管理科學系
科技法律研究所
Department of Management Science
Institute of Technology Law
關鍵字: knowledge document clustering;patent analysis;technology clustering
公開日期: 2006
摘要: Through technology and knowledge document analysis, companies can realise the condition of specified technology development and the potential competitors in the market. As patents provide exclusive right and legal protection for patent inventors, patents play an important role in the development of technology. This paper presents the process of patent knowledge extraction and methodologies of patent analysis to improve the efficiency of patent analysis. Furthermore, the methodologies proposed in this paper include patent map analysis, patent technology clustering, patent document clustering and technology maturity measurement. Through these methodologies, companies can gain rich information and perforin better in patent management. Moreover, the strategic plans of R&D can also be determined using the methodologies proposed in this paper.
URI: http://hdl.handle.net/11536/12813
http://dx.doi.org/10.1504/IJTM.2006.010271
ISSN: 0267-5730
DOI: 10.1504/IJTM.2006.010271
期刊: INTERNATIONAL JOURNAL OF TECHNOLOGY MANAGEMENT
Volume: 36
Issue: 4
起始頁: 336
結束頁: 353
Appears in Collections:Articles