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dc.contributor.authorHa, Neulen_US
dc.contributor.authorMano, Takaakien_US
dc.contributor.authorChou, Ying-Linen_US
dc.contributor.authorWu, Yu-Nienen_US
dc.contributor.authorCheng, Shun-Jenen_US
dc.contributor.authorBocquel, Juanitaen_US
dc.contributor.authorKoenraad, Paul M.en_US
dc.contributor.authorOhtake, Akihiroen_US
dc.contributor.authorSakuma, Yoshikien_US
dc.contributor.authorSakoda, Kazuakien_US
dc.contributor.authorKuroda, Takashien_US
dc.date.accessioned2019-04-03T06:36:01Z-
dc.date.available2019-04-03T06:36:01Z-
dc.date.issued2015-08-10en_US
dc.identifier.issn2469-9950en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.92.075306en_US
dc.identifier.urihttp://hdl.handle.net/11536/128154-
dc.description.abstractMaking use of droplet epitaxy, we systematically controlled the height of self-assembled GaAs quantum dots by more than one order of magnitude. The photoluminescence spectra of single quantum dots revealed the strong dependence of the spectral linewidth on the dot height. Tall dots with a height of similar to 30 nm showed broad spectral peaks with an average width as large as similar to 5 meV, but shallow dots with a height of similar to 2 nm showed resolution-limited spectral lines (<= 120 mu eV). The measured height dependence of the linewidths is in good agreement with Stark coefficients calculated for the experimental shape variation. We attribute the microscopic source of fluctuating electric fields to the random motion of surface charges at the vacuum-semiconductor interface. Our results offer guidelines for creating frequency-locked photon sources, which will serve as key devices for long-distance quantum key distribution.en_US
dc.language.isoen_USen_US
dc.titleSize-dependent line broadening in the emission spectra of single GaAs quantum dots: Impact of surface charge on spectral diffusionen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.92.075306en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume92en_US
dc.citation.issue7en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000359344100011en_US
dc.citation.woscount12en_US
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