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dc.contributor.authorYu, Chien-Hsienen_US
dc.contributor.authorWu, Hung-Chien_US
dc.contributor.authorChien, Chao-Hsinen_US
dc.date.accessioned2015-12-02T02:59:25Z-
dc.date.available2015-12-02T02:59:25Z-
dc.date.issued2015-08-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.7567/JJAP.54.081101en_US
dc.identifier.urihttp://hdl.handle.net/11536/128163-
dc.description.abstractInGaZnO (IGZO) thin-film transistors (TFTs) with hybrid silver nanowires (hybrid-AgNWs) as the source and drain electrodes exhibit superior performance according to the on/off current ratio (approximate to 10(6)), subthreshold swing (SS) (367 mV/decade), and mobility (15.6 cm(2) V-1 s(-1)). The transfer and output characteristics of nanowire-based electrodes are comparable with those of titanium electrodes. The devices are fabricated on a plastic substrate and are highly transparent (>70%) and flexible. The device performance is severely degraded during operation in air, especially under high humidity conditions, and progressive deterioration resulting from water molecule diffusion leads to a high current density when the device is swept. Hence, introducing a passivation layer on the hybrid-AgNW electrodes is imperative. (C) 2015 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleEffect of passivation layer on InGaZnO thin-film transistors with hybrid silver nanowires as source and drain electrodesen_US
dc.typeArticleen_US
dc.identifier.doi10.7567/JJAP.54.081101en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume54en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000360165000005en_US
dc.citation.woscount0en_US
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