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dc.contributor.authorLin, Shih-Yangen_US
dc.contributor.authorChang, Shen-Linen_US
dc.contributor.authorNgoc Thanh Thuy Tranen_US
dc.contributor.authorYang, Po-Huaen_US
dc.contributor.authorLin, Ming-Faen_US
dc.date.accessioned2015-12-02T02:59:33Z-
dc.date.available2015-12-02T02:59:33Z-
dc.date.issued2015-01-01en_US
dc.identifier.issn1463-9076en_US
dc.identifier.urihttp://dx.doi.org/10.1039/c5cp04841aen_US
dc.identifier.urihttp://hdl.handle.net/11536/128339-
dc.description.abstractHydrogenated silicenes possess peculiar properties owing to the strong H-Si bonds, as revealed by an investigation using first principles calculations. Various charge distributions, bond lengths, energy bands, and densities of states strongly depend on different hydrogen configurations and concentrations. The competition between strong H-Si bonds and weak sp(3) hybridization dominate the electronic properties. Chair configurations belong to semiconductors, while the top configurations show a nearly dispersionless energy band at the Fermi level. Both the systems display H-related partially flat bands at middle energy and the recovery of low-lying pi bands during the reduction of concentration. Their densities of states exhibit prominent peaks at middle energy, and the top systems have a delta-funtion-like peak at E = 0. The intensity of these peaks is gradually weakened as the concentration decreases, providing an effective method to identify the H-concentration in scanning tunneling spectroscopy experiments.en_US
dc.language.isoen_USen_US
dc.titleH-Si bonding-induced unusual electronic properties of silicene: a method to identify hydrogen concentrationen_US
dc.typeArticleen_US
dc.identifier.doi10.1039/c5cp04841aen_US
dc.identifier.journalPHYSICAL CHEMISTRY CHEMICAL PHYSICSen_US
dc.citation.volume17en_US
dc.citation.issue39en_US
dc.citation.spage26443en_US
dc.citation.epage26450en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000362291300086en_US
dc.citation.woscount0en_US
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