Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chao, Paul C-P | en_US |
| dc.contributor.author | Hsu, Yen-Ping | en_US |
| dc.contributor.author | Kao, Yung-Hua | en_US |
| dc.contributor.author | Lee, Kuei-Yu | en_US |
| dc.date.accessioned | 2015-12-02T03:00:56Z | - |
| dc.date.available | 2015-12-02T03:00:56Z | - |
| dc.date.issued | 2014-01-01 | en_US |
| dc.identifier.isbn | 978-0-7918-4579-0 | en_US |
| dc.identifier.issn | en_US | |
| dc.identifier.uri | http://hdl.handle.net/11536/128570 | - |
| dc.description.abstract | en_US | |
| dc.language.iso | en_US | en_US |
| dc.title | A New Prediction Model on the Luminance of OLEDs Subjected to Different Reverse Biases for Alleviating Degradation in AMOLED Displays | en_US |
| dc.type | Proceedings Paper | en_US |
| dc.identifier.journal | PROCEEDINGS OF THE ASME CONFERENCE ON INFORMATION STORAGE AND PROCESSING SYSTEMS, 2014 | en_US |
| dc.contributor.department | 電機工程學系 | zh_TW |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Department of Electrical and Computer Engineering | en_US |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.identifier.wosnumber | WOS:000359389600054 | en_US |
| dc.citation.woscount | 0 | en_US |
| Appears in Collections: | Conferences Paper | |

