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dc.contributor.authorLee, Wei Tingen_US
dc.contributor.authorChung, Yung Chien_US
dc.contributor.authorChen, Chu Yuen_US
dc.contributor.authorTang, Jing Jouen_US
dc.contributor.authorYang, Chung Shunen_US
dc.date.accessioned2015-12-02T03:00:58Z-
dc.date.available2015-12-02T03:00:58Z-
dc.date.issued2014-01-01en_US
dc.identifier.isbn978-1-4799-4851-2en_US
dc.identifier.issnen_US
dc.identifier.urihttp://hdl.handle.net/11536/128619-
dc.description.abstractIn this paper, a method called the incident wave excitation method is proposed to incorporate the effects of the coupling noise onto leads of the CAN bus. The equivalent circuit model for two wires (CAN high line and CAN low line) system is firstly derived. The distributed voltage and current sources along the lead excited by the coupling noise can be computed. The set up for the ISO bulk-current injection (BCI) measurement at the IC level is performed. The computed results will be further verified and compared with BCI specific experimental results.en_US
dc.language.isoen_USen_US
dc.titlePrediction of the BCI results For CAN Bus ECU using Incident Wave Excitation Methoden_US
dc.typeProceedings Paperen_US
dc.identifier.journal2014 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS - TAIWAN (ICCE-TW)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000361019800082en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper