標題: Thermoelectric property and x-ray absorption near edge structure studies on Si-doped CaMnO3-delta
作者: Liu, Chia-Jyi
Bhaskar, Ankam
Yuan, J. J.
Yang, Zong-Ren
Chen, Shih-Show
Chen, Huang-Chin
Liao, Fan-Wei
Lin, Yu Ting
Yeh, Ping Hung
Lai, Chun-Yen
Chang, Ching-Lin
材料科學與工程學系
Department of Materials Science and Engineering
關鍵字: Sintering;Electron microscopy;Electrical conductivity;Thermal properties;Thermal conductivity
公開日期: 15-Feb-2016
摘要: We report electrical resistivity, thermopower and Ca K-, Mn L-2,L-3- and O K-edges x-ray absorption near edge structure (XANES) studies on CaMn1-xSixO3-delta with x=0, 0.02, and 0.05. The transport properties measurements indicate that the sample of x=0.02 has the lowest electrical resistivity compared to the samples of x=0 and 0.05. Meanwhile, the temperature dependence of thermopower behaves significantly different for samples of x=0.02 and 0.05. These unusual phenomena are elucidated based on the charge transfer equilibrium principle together with the XANES results, which show that the Si substitution for Mn appears to generate an electron doping effect and lattice distortion. Among the samples, CaMn0.98Si0.02O3-delta exhibits the highest figure of merit of 0.0128 at 300 K. This value represents an improvement of about 52% compared to pristine CaMnO3-delta. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
URI: http://dx.doi.org/10.1016/j.ceramint.2015.11.076
http://hdl.handle.net/11536/129631
ISSN: 0272-8842
DOI: 10.1016/j.ceramint.2015.11.076
期刊: CERAMICS INTERNATIONAL
Volume: 42
起始頁: 4048
結束頁: 4053
Appears in Collections:Articles