標題: | Thermoelectric property and x-ray absorption near edge structure studies on Si-doped CaMnO3-delta |
作者: | Liu, Chia-Jyi Bhaskar, Ankam Yuan, J. J. Yang, Zong-Ren Chen, Shih-Show Chen, Huang-Chin Liao, Fan-Wei Lin, Yu Ting Yeh, Ping Hung Lai, Chun-Yen Chang, Ching-Lin 材料科學與工程學系 Department of Materials Science and Engineering |
關鍵字: | Sintering;Electron microscopy;Electrical conductivity;Thermal properties;Thermal conductivity |
公開日期: | 15-二月-2016 |
摘要: | We report electrical resistivity, thermopower and Ca K-, Mn L-2,L-3- and O K-edges x-ray absorption near edge structure (XANES) studies on CaMn1-xSixO3-delta with x=0, 0.02, and 0.05. The transport properties measurements indicate that the sample of x=0.02 has the lowest electrical resistivity compared to the samples of x=0 and 0.05. Meanwhile, the temperature dependence of thermopower behaves significantly different for samples of x=0.02 and 0.05. These unusual phenomena are elucidated based on the charge transfer equilibrium principle together with the XANES results, which show that the Si substitution for Mn appears to generate an electron doping effect and lattice distortion. Among the samples, CaMn0.98Si0.02O3-delta exhibits the highest figure of merit of 0.0128 at 300 K. This value represents an improvement of about 52% compared to pristine CaMnO3-delta. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.ceramint.2015.11.076 http://hdl.handle.net/11536/129631 |
ISSN: | 0272-8842 |
DOI: | 10.1016/j.ceramint.2015.11.076 |
期刊: | CERAMICS INTERNATIONAL |
Volume: | 42 |
起始頁: | 4048 |
結束頁: | 4053 |
顯示於類別: | 期刊論文 |