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dc.contributor.authorChen, THen_US
dc.contributor.authorLiou, Yen_US
dc.contributor.authorWu, TJen_US
dc.contributor.authorChen, JYen_US
dc.date.accessioned2014-12-08T15:17:52Z-
dc.date.available2014-12-08T15:17:52Z-
dc.date.issued2005-12-12en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2137892en_US
dc.identifier.urihttp://hdl.handle.net/11536/12964-
dc.description.abstractOrganic light-emitting devices were fabricated by using vanadium-doped indium tin oxide (ITO) as the hole-injection layers between the hole transport layer, N,N-'-dia(1-napthl)-N,N-'-diphenyl benzidine and the ITO anode. The vanadium-doped ITO layer was 15-nm thick with three different vanadium concentrations (6, 10.5, and 12.5 mol %). Three different resistivities (10, 500, and 10 000 Omega cm) and work functions (5, 5.2, and 5.4 eV) were obtained. The device with 6 mol % V-doped ITO layer possessing the least resistivity (10 Omega cm) and work function (5 eV) has the lowest turn-on voltage (below 3 V), the lowest operating voltage (below 7 V), the highest luminance (1000 cd/m(2) below 7 V), and the highest power efficiency (>5 1m/W at 10 mA/cm(2)) among all. Such performance was attributed to the balance between the carrier concentration and the energy barrier for the hole injection.en_US
dc.language.isoen_USen_US
dc.titleVanadium-doped indium tin oxide as hole-injection layer in organic light-emitting devicesen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2137892en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume87en_US
dc.citation.issue24en_US
dc.citation.epageen_US
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentInstitute of Displayen_US
dc.identifier.wosnumberWOS:000233825900100-
dc.citation.woscount6-
顯示於類別:期刊論文


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