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dc.contributor.authorChou, Chun-Tseen_US
dc.contributor.authorHudec, Borisen_US
dc.contributor.authorHsu, Chung-Weien_US
dc.contributor.authorLai, Wei-Lien_US
dc.contributor.authorChang, Chih-Chengen_US
dc.contributor.authorHou, Tuo-Hungen_US
dc.date.accessioned2016-03-28T00:05:42Z-
dc.date.available2016-03-28T00:05:42Z-
dc.date.issued2015-11-01en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.microrel.2015.04.002en_US
dc.identifier.urihttp://hdl.handle.net/11536/129776-
dc.description.abstractIn this work, we have implemented self-rectifying TaOx/TiO2 REAM in a selector-less 6 x 6 crossbar array with various desiring features, including: (1) simple fabrication using only three masks, (2) high self-rectifying ratio up to 10(3) for sneak current suppression, (3) stable bipolar resistive-switching characteristics without the need for electro-forming and current compliance, (4) data retention time over 10(4) s, and (5) robust READ and WRITE disturb immunity. Finally, an achievable array size of 1 Mb was simulated using an All-LPU read scheme and a V/3 write scheme. (C) 2015 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectRRAMen_US
dc.subjectCrossbar arrayen_US
dc.subjectForming-freeen_US
dc.subjectSelf-rectifyingen_US
dc.subjectBilayeren_US
dc.subjectTiO2en_US
dc.titleCrossbar array of selector-less TaOx/TiO2 bilayer RRAMen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.microrel.2015.04.002en_US
dc.identifier.journalMICROELECTRONICS RELIABILITYen_US
dc.citation.volume55en_US
dc.citation.issue11en_US
dc.citation.spage2220en_US
dc.citation.epage2223en_US
dc.contributor.department電機學院zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000367282100010en_US
dc.citation.woscount0en_US
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